Dynamics of phasons; Phase defects formed on dimer rows, and related structural changes of the Si(100) surface at 80 K studied by scanning tunneling microscopy

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 36, Issue 3 A, 1997, Pages

  Shigekawa, Hidemi ^a   Miyake, Koji ^a   Ishida, Masahiko ^a   Hata, Kenji ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR DOPING; SURFACE STRUCTURE;

DIMERS; PHASE DEFECTS; PHASONS;

SEMICONDUCTING SILICON;

EID: 0031099537     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.l294     Document Type: Article

References (13)