Detection of the flip-flop motion of buckled dimers on a Ge(001) surface by STM

Journal of Electron Microscopy

Volumn 48, Issue 1, 1999, Pages 1-7

  Sato, Tomoshige ^a   Iwatsuki, Masashi ^a   Tochihara, Hiroshi ^b  

^a JEOL LTD   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

Buckled dimer; Flip flop motion; Ge(001); Scanning tunnelling microscopy; Time dependent phenomenon; Variable temperature

Indexed keywords

ATOMS; BUCKLING; DIMERS; FLIP FLOP CIRCUITS;

BUCKLED DIMER; DYNAMIC BEHAVIORS; FLIP FLOP MOTIONS; FUNCTION OF TIME; SURFACE ATOMS; SURFACE DIMERS; SYMMETRICS; TIME DEPENDENT PHENOMENA; TUNNELING CURRENT; VARIABLE TEMPERATURE;

SCANNING TUNNELING MICROSCOPY;

EID: 0032989566     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023644     Document Type: Article

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