Direct evidence for asymmetric dimer on Si(100) at low temperature by means of high-resolution Si 2p photoelectron spectroscopy

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 41, Issue 3 A, 2002, Pages

  Yamashita, Yoshiyuki ^a   Machida, Shin Ichi ^a   Nagao, Masashi ^a   Yamamoto, Susumu ^a   Kakefuda, Youhei ^a   Mukai, Kozo ^a   Yoshinobu, Jun ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Asymmetric dimer; Low temperature; Photoelectron spectroscopy; Si 2p; Si(100); Symmetric dimer

Indexed keywords

DIMERS; ELECTRONIC STRUCTURE; GROUND STATE; LOW ENERGY ELECTRON DIFFRACTION; LOW TEMPERATURE EFFECTS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SPECTRUM ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ASYMMETRIC DIMERS;

SURFACE TOPOGRAPHY;

EID: 0036508833     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.l272     Document Type: Article

References (23)