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Volumn 72, Issue 10, 2003, Pages 2425-2428
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Local and reversible change of the reconstruction on Ge(001) surface between c(4 × 2) and p(2 × 2) by scanning tunneling microscopy
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Author keywords
c(4 2); Ge(001) surface; Inelastic tunneling process; p(2 2); Reconstruction; Scanning tunneling microscope
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Indexed keywords
GERMANIUM;
ARTICLE;
ELECTRIC FIELD;
ELECTRIC POTENTIAL;
ENERGY TRANSFER;
HYSTERESIS;
IMAGE RECONSTRUCTION;
SCANNING TUNNELING MICROSCOPY;
STRUCTURE ANALYSIS;
SURFACE PROPERTY;
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EID: 0242626573
PISSN: 00319015
EISSN: None
Source Type: Journal
DOI: 10.1143/JPSJ.72.2425 Document Type: Article |
Times cited : (33)
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References (20)
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