Low-energy electron diffraction study of the phase transition of Si(001) surface below 40 K

Physical Review Letters

Volumn 90, Issue 10, 2003, Pages

  Matsumoto, M ^a   Fukutani, K ^a   Okano, T ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON IRRADIATION; LOW ENERGY ELECTRON DIFFRACTION; PHASE TRANSITIONS; QUANTUM THEORY; SURFACE STRUCTURE; THERMAL EFFECTS; THERMAL EXPANSION;

DEBYE-WALLER LAW; QUARTER ORDER DIFFRACTION; TEMPERATURE DEPENDENCE;

SEMICONDUCTING SILICON;

EID: 0037965975     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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