Surface dynamics studied by perturbing the surface with the tip of a scanning tunneling microscope - Si(100) at 80 K

Applied Physics Letters

Volumn 73, Issue 1, 1998, Pages 40-42

  Hata, K ^a   Ishida, M ^a   Miyake, K ^a   Shigekawa, H ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003037509     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121716     Document Type: Article

References (10)

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