Metal nanostructures assembled at semiconductor surfaces studied with high resolution scanning probes

Nanotechnology

Volumn 18, Issue 4, 2007, Pages

  Szymonski, M ^a   Goryl, M ^a   Krok, F ^a   Kolodziej, J J ^a   Buatier De Mongeot, F ^b  

^a JAGIELLONIAN UNIVERSITY   (Poland)

^b UNIVERSITY OF GENOA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS;

DYNAMIC FORCE MICROSCOPY (DFM); KELVIN PROBE FORCE MICROSCOPY (KPFM); NANOWIRES; SCANNING TUNNELLING SPECTROSCOPY (STS);

NANOSTRUCTURED MATERIALS;

EID: 33846817414     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/4/044016     Document Type: Article

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