Thickness effect on the microstructure, morphology and optoelectronic properties of ZnS films

Journal of Physics Condensed Matter

Volumn 20, Issue 3, 2008, Pages

  Prathap, P ^a   Revathi, N ^a   Venkata Subbaiah, Y P ^b   Ramakrishna Reddy, K T ^a  

^a SRI VENKATESWARA UNIVERSITY   (India)

^b YOGI VEMANA UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FILM THICKNESS; MICROSTRUCTURE; OPTOELECTRONIC DEVICES; SURFACE MORPHOLOGY; ZINC SULFIDE;

HEXAGONAL STRUCTURE; OPTOELECTRONIC PROPERTIES; THICKNESS EFFECT;

THIN FILMS;

EID: 43049139193     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/03/035205     Document Type: Article

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