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Volumn 88, Issue 5, 2000, Pages 2437-2442

Oxygen incorporation in thin films of In2O3:Sn prepared by radio frequency sputtering

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000531083     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1287603     Document Type: Article
Times cited : (56)

References (29)
  • 4
    • 85037460031 scopus 로고    scopus 로고
    • (private communication), following a procedure described in Ref. 5
    • M. Schlott (private communication), following a procedure described in Ref. 5.
    • Schlott, M.1
  • 6
    • 0037997768 scopus 로고
    • ASTM, JCPDS-ICDD 6-416 Philadelphia, PA
    • Joint Committee on Powder Diffraction Standards, Powder Diffraction File, ASTM, JCPDS-ICDD 6-416 Philadelphia, PA, 1991.
    • (1991) Powder Diffraction File
  • 24
    • 85037480526 scopus 로고    scopus 로고
    • private communication
    • B. Szyszka (private communication).
    • Szyszka, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.