Structural, electrical and optical properties of ZnS films deposited by close-spaced evaporation

Applied Surface Science

Volumn 253, Issue 5, 2006, Pages 2409-2415

  Subbaiah, Y P Venkata ^a   Prathap, P ^a   Reddy, K T Ramakrishna ^a  

^a SRI VENKATESWARA UNIVERSITY   (India)

Author keywords

Close spaced evaporation; Optical properties; Structure; ZnS films

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRIC PROPERTIES; EVAPORATION; FILM GROWTH; OPTICAL PROPERTIES; X RAY DIFFRACTION ANALYSIS; ZINC SULFIDE;

CLOSE-SPACED EVAPORATION (CSE) TECHNIQUE; ENERGY BAND GAP; ZNS FILMS;

CONDUCTIVE FILMS;

EID: 33751433447     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.04.063     Document Type: Article

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