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Volumn , Issue , 2006, Pages

Characterization of SiC JFET for temperature dependent device modeling

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; ENERGY GAP; SEMICONDUCTOR MATERIALS; SILICON CARBIDE; SWITCHING CIRCUITS;

EID: 42449100348     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PESC.2006.1712168     Document Type: Conference Paper
Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.