SiC MESFETs for high-frequency applications

MRS Bulletin

Volumn 30, Issue 4, 2005, Pages 308-311

  Sriram, S ^a   Ward, A ^a   Henning, J ^a   Allen, S T ^a  

^a NONE

Author keywords

MESFETs; MMICs; Reliability; Rf power; Silicon carbide; Trapping

Indexed keywords

INSULATING MATERIALS; MESFET DEVICES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; POWER AMPLIFIERS; RELIABILITY; SUBSTRATES;

GAAS TECHNOLOGY; JUNCTION TEMPERATURE; RF POWER; TRAPPING;

SILICON CARBIDE;

EID: 33744810367     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2005.79     Document Type: Article

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