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Volumn 39, Issue 10, 2007, Pages 836-844

Combined IR and XPS analysis of the native (100) surface of single-crystalline silicon after HFaq etching

Author keywords

Angle resolved XPS; MIR IR; Silicon surface

Indexed keywords

ETCHING; SINGLE CRYSTAL SURFACES; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 35348949952     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2599     Document Type: Article
Times cited : (14)

References (39)
  • 37
    • 35348965538 scopus 로고    scopus 로고
    • Chu W-K, Mayer JW, Nicolet M-A, Backscattering Spectrometry. Academic Press: Orlando, 1978; Table 8.3.
    • Chu W-K, Mayer JW, Nicolet M-A, Backscattering Spectrometry. Academic Press: Orlando, 1978; Table 8.3.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.