CO2 and C2H4 grafting to the native defects of ion-bombarded porous silica

Applied Physics A: Materials Science and Processing

Volumn 68, Issue 1, 1999, Pages 29-39

  Cerofolini, G F ^a   Meda, L ^b  

^a STMICROELECTRONICS   (Italy)

^b Istituto Guido Donegani SpA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE; ETHYLENE; GRAFTING (CHEMICAL); INFRARED SPECTROSCOPY; ION BOMBARDMENT; MOLECULAR DYNAMICS; OXYGEN; POINT DEFECTS; POROUS MATERIALS; QUANTUM THEORY; RADIATION DAMAGE; THERMODYNAMIC STABILITY;

DENSITY FUNCTIONAL METHOD;

SILICA;

EID: 0032761042     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050850     Document Type: Article

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