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Volumn 931, Issue , 2007, Pages 43-52

Review of NSOM microscopy for materials

Author keywords

Apertureless NSOM; Nano optics; Near field optics; NSOM; Optical characterization; Optical imaging; Scanning probe microscopy; Scattering type NSOM

Indexed keywords


EID: 35348822472     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2799414     Document Type: Conference Paper
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.