Imaging subwavelength holes using an apertureless near-field scanning optical microscope

Journal of Applied Physics

Volumn 93, Issue 12, 2003, Pages 9548-9552

  Formanek, F ^a   De Wilde, Y ^a   Aigouy, L ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; ELECTRIC FIELDS; LIGHT POLARIZATION; LIGHT SCATTERING; OPTICAL MICROSCOPY;

SUBWAVELENGTH HOLES;

NANOTECHNOLOGY;

EID: 0037805711     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1574178     Document Type: Article

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