Single molecule mapping of the optical field distribution of probes for near-field microscopy

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 477-482

  Veerman, J A ^a   Garcia Parajo, M F ^a   Kuipers, L ^a   Van Hulst, N F ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Fluorescence microscopy; Focused ion beam; Near field scanning optical microscopy; Shear force microscopy; Single molecule detection

Indexed keywords

FLUORESCENCE; FOCUSED ION BEAMS; MOLECULES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA PROCESSING; OPTICAL DATA STORAGE; POLARIZATION; PROBES;

APERTURE PROBES; END FACES; FOCUSED IONS BEAMS; NEAR FIELDS; NEARFIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLUTION; POLARIZATION CHARACTERISTICS; SHEAR FORCE MICROSCOPY; SINGLE MOLECULE; SINGLE-MOLECULE DETECTION;

FLUORESCENCE MICROSCOPY;

CONFERENCE PAPER; FLUORESCENCE MICROSCOPY; GEOMETRY; IMAGE QUALITY; MEASUREMENT; MICROSCOPY; OPTICS; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0032991884     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00520.x     Document Type: Conference Paper

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