Fabrication and characterization of fluorescent rare-earth-doped glass-particle-based tips for near-field optical imaging applications

Applied Optics

Volumn 43, Issue 19, 2004, Pages 3829-3837

  Aigouy, Lionel ^a   De Wilde, Yannick ^a   Mortier, Michel ^b   Giérak, Jacques ^c   Bourhis, Eric ^c  

^a PSL RESEARCH UNIVERSITY   (France)

^b UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); GLASS; LIGHT SCATTERING; OPTICAL FIBERS; PIEZOELECTRIC DEVICES; RARE EARTH ELEMENTS;

GLASS PARTICLES; ION BEAM MILLING; PIEZOELECTRIC SCANNERS;

IMAGING TECHNIQUES;

EID: 3142726417     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.003829     Document Type: Article

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