Scanning thermal imaging of microelectronic circuits with a fluorescent nanoprobe

Applied Physics Letters

Volumn 87, Issue 18, 2005, Pages 1-3

  Aigouy, Lionel ^a   Tessier, Gilles ^a   Mortier, Michel ^b   Charlot, Benòt ^c  

^a CNRS   (France)

^b UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^c TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; INFRARED IMAGING; MOS CAPACITORS; SENSORS; TEMPERATURE DISTRIBUTION;

FLUORESCENT PARTICLE; TEMPERATURE DEPENDENCE; TEMPERATURE SENSOR;

NETWORKS (CIRCUITS);

EID: 27344451401     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2123384     Document Type: Article

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