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Volumn 84, Issue 22, 2000, Pages 5156-5159
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Scattering theory of bardeen’s formalism for tunneling: New approach to near-field microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000127297
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.84.5156 Document Type: Article |
Times cited : (35)
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References (37)
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