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Volumn 53, Issue 2, 2007, Pages 823-828

Macropore density as a function of HF-concentration and bias

Author keywords

Current burst model; HF concentration; Macropore density; Penetrating and focusing power; SCR width

Indexed keywords

DOPING (ADDITIVES); ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; ELECTROLYTES; ETCHING; SILICON;

EID: 35148883045     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2007.07.065     Document Type: Article
Times cited : (8)

References (46)
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    • Parkhutik V.P. Morphology of porous silicon layers. In: Feng Z.C., and Tsu R. (Eds). Porous Silicon World Scientific (1994) 301
    • (1994) Porous Silicon World Scientific , pp. 301
    • Parkhutik, V.P.1
  • 38
    • 35148890367 scopus 로고    scopus 로고
    • H.A. Bethe, MIT Radiation Laboratory, Report 43-12, 1942.
  • 39
    • 35148862706 scopus 로고    scopus 로고
    • H. Ohji, Macroporous Si based micromachining, Ph.D. thesis, 2002, Delft, the Netherlands, ISBN 90-5166-90.
  • 40
    • 26844454152 scopus 로고    scopus 로고
    • Y. Chen, L.W. Wang, P.M. Sarro, Highly controllable electrochemical deep etching process on silicon, MEMS 2005, 30 January-3 February, p. 512, doi:10.1109/MEMSYS.2005.1453979.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.