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International Journal of Materials Research

Volumn 97, Issue 7, 2006, Pages 890-898

Off-axis electron holography: Materials analysis at atomic resolution

(3) Linck, Martin a,c Lichte, Hannes a Lehmann, Michael b

a DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

b TECHNISCHE UNIVERSITÄT BERLIN (Germany)

c NONE (Germany)

Author keywords

Atomic resolution; Off axis electron holography; Simulation

Indexed keywords

COMPUTER SIMULATION; ELECTRON HOLOGRAPHY; ELECTRON MICROSCOPES; IMAGE RECONSTRUCTION; PHASE SHIFT;

ATOMIC PHASE SHIFT; ATOMIC RESOLUTIONS; OFF-AXIS ELECTRON HOLOGRAPHY; PHASE DETECTION;

PARTICLE OPTICS;

EID: 33746923509 PISSN: 18625282 EISSN: None Source Type: Journal
DOI: 10.3139/146.101317 Document Type: Article

Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.