Inelastic scattering and holography

Ultramicroscopy

Volumn 81, Issue 3-4, 2000, Pages 187-194

  Van Dyck, D ^a   Lichte, H ^b   Spence, J C H ^c  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRONIC DENSITY OF STATES; HOLOGRAPHY; LIGHT INTERFERENCE; MATHEMATICAL MODELS;

ELECTRON WAVE; HAMILTONIAN METHODS; INCIDENT BEAM SPECTRUM; REFERENCE WAVE;

ELECTRON SCATTERING;

ARTICLE; CONTRAST; ELECTRON BEAM; FILTER; HOLOGRAPHY; IMAGING SYSTEM; OPTICAL RESOLUTION; TECHNIQUE; THEORY;

EID: 0034024154     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00002-4     Document Type: Article

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