Optical and physical properties of solgel-derived GeO2:SiO 2 films in photonic applications

Applied Optics

Volumn 46, Issue 20, 2007, Pages 4397-4406

  Ho, Charles K F ^a   Rajni, ^a   Djie, H S ^a,b   Pita, Kantisara ^a   Ngo, Nam Quoc ^a   Osipowicz, T ^c  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b Lehigh University   (United States)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ENHANCEMENT; MICROSTRUCTURE; OPTICAL PROPERTIES; PHOTONICS; SOL-GEL PROCESS; ULTRAVIOLET RADIATION;

COMPOSITION-DEPENDENT PROPERTIES; GERMANOSILICATE MATERIALS; OPTICAL COMPONENTS; QUANTUM-WELL OPTICAL DEVICES;

OPTICAL FILMS;

EID: 34548497193     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.004397     Document Type: Article

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