Optical functions of (x)GeO2:(1-x)SiO2 films determined by multi-sample and multi-angle spectroscopic ellipsometry

Optics Express

Volumn 13, Issue 3, 2005, Pages 1049-1054

  Ho, Charles K F ^a   Pita, K ^a   Ngo, N Q ^a   Kam, C H ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ELLIPSOMETRY; FABRICATION; GERMANIUM COMPOUNDS; INTEGRATED OPTICS; OPTICAL COMMUNICATION; OPTICAL GLASS; SILICA; SOL-GELS; VISUALIZATION;

OPTICAL DISPERSIONS; OPTICAL FUNCTIONS; SPECTROSCOPIC ELLIPSOMETRY (SE); ZERO-DISPERSION WAVELENGTH;

THIN FILMS;

EID: 14744297791     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.001049     Document Type: Article

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