Dynamic force spectroscopy using the frequency modulation technique with constant excitation

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 15, 2003, Pages 1534011-1534014

  Holscher H ^a,c   Gotsmann, B ^b   Schirmeisen, A ^c  

^a CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR   (Germany)

^b IBM RESEARCH ZURICH   (Switzerland)

^c UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AIR; AMPLITUDE MODULATION; ARTICLE; DYNAMIC FORCE MICROSCOPE; DYNAMIC FORCE SPECTROSCOPY; DYNAMICS; EXCITATION; FORCE; FREQUENCY MODULATION; LIQUID; MEASUREMENT; MICROSCOPE; OSCILLATION; SAMPLE; SPECTROSCOPY; THEORY; VACUUM;

EID: 5144231169     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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