Impact of NBTI on SRAM read stability and design for reliability

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn , Issue , 2006, Pages 210-218

  Kumar, Sanjay V ^a   Kim, Chris H ^a   Sapatnekar, Sachin S ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

Cache; Negative Bias Temperature Instability (NBTI); Reaction Diffusion (R D) Model.; SRAM; Static Noise Margin (SNM)

Indexed keywords

CACHE; DESIGN FOR RELIABILITY; IMPLEMENTATION METHODOLOGY; NANOMETER SCALE DEVICES; NEGATIVE BIAS TEMPERATURE INSTABILITY; REACTION-DIFFUSION MODELS; STATIC NOISE MARGIN; TEMPORAL PERFORMANCE;

DESIGN; DIFFUSION IN LIQUIDS; NEGATIVE TEMPERATURE COEFFICIENT; STATIC RANDOM ACCESS STORAGE; THERMODYNAMIC STABILITY;

INTEGRATED CIRCUITS;

EID: 84886738276     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2006.73     Document Type: Conference Paper

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