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Volumn 15, Issue 2, 2006, Pages 197-216

Signal-path-level dual-Vt assignment for leakage power reduction

Author keywords

Dual threshold voltage; Graph algorithm; Leakage power; Signal path level threshold voltage assignment; Static delay model

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; GATES (TRANSISTOR); MATHEMATICAL MODELS; NETWORKS (CIRCUITS); THRESHOLD VOLTAGE;

EID: 33746878463     PISSN: 02181266     EISSN: None     Source Type: Journal    
DOI: 10.1142/S021812660600299X     Document Type: Article
Times cited : (11)

References (22)
  • 1
    • 0035007816 scopus 로고    scopus 로고
    • Formulation and validation of an energy dissipation model for the clock generation circuitry and distribution networks
    • D. Duarte, N. Vijaykrishnan, M. J. Irwin and M. Kandemir, Formulation and validation of an energy dissipation model for the clock generation circuitry and distribution networks, Proc. Int. Conf. VLSI Design (2001), pp. 248-253.
    • (2001) Proc. Int. Conf. VLSI Design , pp. 248-253
    • Duarte, D.1    Vijaykrishnan, N.2    Irwin, M.J.3    Kandemir, M.4
  • 2
    • 0030146154 scopus 로고    scopus 로고
    • Power dissipation analysis and optimization of deep submicron CMOS digital circuits
    • R. X. Gu and M. I. Elmasry, Power dissipation analysis and optimization of deep submicron CMOS digital circuits, IEEE J. Solid State Circuits 31 (1996) 887-893.
    • (1996) IEEE J. Solid State Circuits , vol.31 , pp. 887-893
    • Gu, R.X.1    Elmasry, M.I.2
  • 3
    • 0023401686 scopus 로고
    • BSIM: Berkeley short-channel IGFET model for MOS transistors
    • B. J. Sheu et al., BSIM: Berkeley short-channel IGFET model for MOS transistors, IEEE J. Solid State Circuits 22 (1987) 558-566.
    • (1987) IEEE J. Solid State Circuits , vol.22 , pp. 558-566
    • Sheu, B.J.1
  • 4
    • 0038645647 scopus 로고    scopus 로고
    • No exponential is forever: But forever can be delayed
    • G. Moore, No exponential is forever: But forever can be delayed, IEEE ISSCC Dig. Tech. Papers (2003), pp. 20-23.
    • (2003) IEEE ISSCC Dig. Tech. Papers , pp. 20-23
    • Moore, G.1
  • 5
    • 0036907029 scopus 로고    scopus 로고
    • Subthreshold leakage modeling and reduction techniques
    • J. Kao, S. Narendra and A. Chandrakasan, Subthreshold leakage modeling and reduction techniques, ICCAD (2002), pp. 141-149.
    • (2002) ICCAD , pp. 141-149
    • Kao, J.1    Narendra, S.2    Chandrakasan, A.3
  • 13
    • 0036374228 scopus 로고    scopus 로고
    • Leakage-tolerant design techniques for high performance processors
    • 7-10 April San Diego, California, USA
    • V. De, Leakage-tolerant design techniques for high performance processors (invited paper), Proc. 2002 Int. Symp. Physical Design, 7-10 April 2002, San Diego, California, USA, p. 28.
    • (2002) Proc. 2002 Int. Symp. Physical Design , pp. 28
    • De, V.1
  • 14
    • 0033100297 scopus 로고    scopus 로고
    • Design and optimization of dual threshold circuits follow voltage, low power applications
    • L. Wei, Z. Chen and K. Roy, Design and optimization of dual threshold circuits follow voltage, low power applications, IEEE Trans. VLSI Syst. 17 (1999) 16-24.
    • (1999) IEEE Trans. VLSI Syst. , vol.17 , pp. 16-24
    • Wei, L.1    Chen, Z.2    Roy, K.3
  • 15
    • 0001336865 scopus 로고    scopus 로고
    • Low power synthesis of dual threshold voltage CMOS VLSI circuits
    • V. Sundararajan and K. K. Parhi, Low power synthesis of dual threshold voltage CMOS VLSI circuits, Proc. ISLPED (1999), pp. 363-368.
    • (1999) Proc. ISLPED , pp. 363-368
    • Sundararajan, V.1    Parhi, K.K.2
  • 16
    • 0035014649 scopus 로고    scopus 로고
    • Optimal assignment of high threshold voltage for synthesizing dual threshold CMOS circuits
    • 3-7 January
    • N. Tripathi, A. Bhosle, D. Samanta and A. Pal, Optimal assignment of high threshold voltage for synthesizing dual threshold CMOS circuits, Fourteenth Int. Conf. VLSI Design, 3-7 January 2001, pp. 227-232.
    • (2001) Fourteenth Int. Conf. VLSI Design , pp. 227-232
    • Tripathi, N.1    Bhosle, A.2    Samanta, D.3    Pal, A.4
  • 18
    • 0030387081 scopus 로고    scopus 로고
    • t MOSFET process and energy-delay measurement
    • t MOSFET process and energy-delay measurement, IEDM Dig. (1996), p. 851.
    • (1996) IEDM Dig. , pp. 851
    • Chen, Z.1
  • 19
    • 0032667127 scopus 로고    scopus 로고
    • Mixed-Vth (MVT) CMOS circuit design methodology for low power applications
    • 21-25 June
    • L. Wei, Z. Chen, K. Roy, Y. Yibin and V. De, Mixed-Vth (MVT) CMOS circuit design methodology for low power applications, Design Automation Conf. 1999. Proc. 36th, 21-25 June 1999, pp. 430-435.
    • (1999) Design Automation Conf. 1999. Proc. 36th , pp. 430-435
    • Wei, L.1    Chen, Z.2    Roy, K.3    Yibin, Y.4    De, V.5
  • 21
    • 0030398511 scopus 로고    scopus 로고
    • Design methodology of deep submicron CMOS devices for 1 v operation
    • H. Oyamatsu et al., Design methodology of deep submicron CMOS devices for 1 V operation, IEICE Trans. Electron ET9-C (1996) 1720-1724.
    • (1996) IEICE Trans. Electron , vol.ET9-C , pp. 1720-1724
    • Oyamatsu, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.