Interval-valued reduced-order statistical interconnect modeling

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 26, Issue 9, 2007, Pages 1602-1613

  Ma, James D ^b,c   Rutenbar, Rob A ^a,b  

^a IEEE

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Affine arithmetic; Design for manufacturing; Interconnect simulation; Numerical analysis; Statistical modeling

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; ASYMPTOTIC ANALYSIS; CAPACITANCE; ELECTRIC RESISTANCE; INDUCTANCE; PROBABILITY DENSITY FUNCTION; STATISTICAL METHODS; UNCERTAINTY ANALYSIS; WAVEFORM ANALYSIS;

AFFINE ARITHMETICS; DESIGN-FOR-MANUFACTURING; INTERCONNECT SIMULATION; STATISTICAL MODELING;

INTERCONNECTION NETWORKS;

EID: 34548292532     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2007.895577     Document Type: Article

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