Stochastic analysis of interconnect performance in the presence of process variations

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2004, Pages 880-886

  Wang, Janet ^a   Ghanta, Praveen ^a   Vrudhula, Sarma ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT PERFORMANCE; ELECTRICAL PARAMETERS; PROCESS VARIATION; STOCHASTIC ANALYSIS;

COMPUTER SIMULATION; ERROR ANALYSIS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MONTE CARLO METHODS; PERTURBATION TECHNIQUES; RANDOM PROCESSES;

INTERCONNECTION NETWORKS;

EID: 16244379528     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2004.1382698     Document Type: Conference Paper

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