Time-domain simulation of variational interconnect models

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2002-January, Issue , 2002, Pages 419-424

  Acar, E ^a   Nassif, S ^a   Liu, Ying ^a   Pileggi, L T ^b  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Admittance; Circuit simulation; Integrated circuit interconnections; Linear systems; Nonlinear circuits; Reduced order systems; Stability; Time domain analysis; Vectors; Voltage

Indexed keywords

CIRCUIT SIMULATION; CONVERGENCE OF NUMERICAL METHODS; ELECTRIC ADMITTANCE; ELECTRIC NETWORK ANALYSIS; ELECTRIC POTENTIAL; INTEGRATED CIRCUIT INTERCONNECTS; LINEAR SYSTEMS; NONLINEAR ANALYSIS; VECTORS;

GLOBAL INTERCONNECTS; INTEGRATED CIRCUIT INTERCONNECTIONS; INTEGRATION TECHNOLOGIES; INTERCONNECT PARAMETER; NONLINEAR CIRCUIT; REDUCED ORDER SYSTEMS; TIME-DOMAIN SIMULATIONS; TRANSISTOR-LEVEL SIMULATION;

TIME DOMAIN ANALYSIS;

EID: 84948468889     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2002.996782     Document Type: Conference Paper

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