Fast interval-valued statistical interconnect modeling and reduction

Proceedings of the International Symposium on Physical Design

Volumn , Issue , 2005, Pages 159-166

  Ma, James D ^a   Rutenbar, Rob A ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Affine Arithmetic; Interval Valued Statistical Interconnect Analysis; Manufacturing Variation

Indexed keywords

COMPUTATIONAL COMPLEXITY; MATHEMATICAL MODELS; MATHEMATICAL OPERATORS; MONTE CARLO METHODS; PARAMETER ESTIMATION; PROBLEM SOLVING; STATISTICAL METHODS;

AFFINE ARITHMETIC; INTERVAL-VALUED STATISTICAL INTERCONNECT ANALYSIS; MANUFACTURING VARIATION;

INTERCONNECTION NETWORKS;

EID: 29144530527     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1055137.1055170     Document Type: Conference Paper

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