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Volumn 306, Issue 2, 2007, Pages 292-296

Structural characterization of InN films grown on different buffer layers by metalorganic chemical vapor deposition

Author keywords

A1. Atomic force microscopy; A1. X ray diffraction; A3. Metalorganic chemical vapor deposition; B1. InN

Indexed keywords

ATOMIC FORCE MICROSCOPY; GALLIUM NITRIDE; INDIUM COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; X RAY DIFFRACTION;

EID: 34547680291     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.05.052     Document Type: Article
Times cited : (17)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.