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Volumn 306, Issue 2, 2007, Pages 297-302

Erratum to "Fast homoepitaxial growth of 4H-SiC with low basal-plane dislocation density and low trap concentration by hot-wall chemical vapor deposition". [J. Crystal Growth 306 (2007) 297] (DOI:10.1016/j.jcrysgro.2007.05.009);Fast homoepitaxial growth of 4H-SiC with low basal-plane dislocation density and low trap concentration by hot-wall chemical vapor deposition

Author keywords

A3. Hot wall epitaxy; A3. Vapor phase epitaxy; B2. Semiconducting materials

Indexed keywords

CHEMICAL VAPOR DEPOSITION; EPITAXIAL GROWTH; GROWTH RATE; PHOTOLUMINESCENCE; SEMICONDUCTOR MATERIALS;

EID: 34547667330     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.08.023     Document Type: Erratum
Times cited : (69)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.