Analog/RF performance of Si nanowire MOSFETs and the impact of process variation

IEEE Transactions on Electron Devices

Volumn 54, Issue 6, 2007, Pages 1288-1294

  Wang, Runsheng ^a   Zhuge, Jing ^a   Huang, Ru ^a   Tian, Yu ^a   Xiao, Han ^a   Zhang, Liangliang ^a   Li, Chen ^a   Zhang, Xing ^a   Wang, Yangyuan ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

Analog; Process variation; Radio frequency (RF); Si nanowire transistor (SNWT)

Indexed keywords

CUTOFF FREQUENCY; NANOWIRES; SEMICONDUCTING SILICON; TRANSCONDUCTANCE;

OSCILLATION FREQUENCY; PROCESS VARIATION; RADIO FREQUENCY; SILICON NANOWIRE TRANSISTOR;

MOSFET DEVICES;

EID: 34249905456     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.896598     Document Type: Article

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