Comparison of electronic transport characterization methods for alkanethiol self-assembled monolayers

Journal of Physical Chemistry B

Volumn 108, Issue 25, 2004, Pages 8742-8750

  Lee, Takhee ^a,b   Wang, Wenyong ^a   Klemic, James F ^a   Zhang, Jingshen J ^a   Su, Jie ^a   Reed, Mark A ^a  

^a Yale University   (United States)

^b Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BOND FORMATION; ELECTRONIC SYSTEMS; METAL-INSULATOR-METAL (MIM) TUNNELING; MOLECULAR ORBITALS;

ANNEALING; CHARGE TRANSFER; CHEMISORPTION; CURRENT VOLTAGE CHARACTERISTICS; DEFORMATION; ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; LITHOGRAPHY; MIM DEVICES; ORGANIC COMPOUNDS;

SELF ASSEMBLY;

EID: 3142686789     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp049541r     Document Type: Article

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