Artifacts identification in apertureless near-field optical microscopy

Journal of Applied Physics

Volumn 101, Issue 6, 2007, Pages

  Gucciardi, P G ^a   Bachelier, G ^b   Allegrini, M ^a,c   Ahn, J ^d   Hong, M ^d   Chang, S ^d   Jhe, W ^d   Hong, S C ^e   Baek, S H ^e  

^a CNR   (Italy)

^b UNIVERSITÉ LYON 1   (France)

^c UNIVERSITY OF PISA   (Italy)

^d Seoul National University   (South Korea)

^e Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DEMODULATION; HARMONIC DISTORTION; MATHEMATICAL MODELS; NANOPARTICLES; OPTICAL CORRELATION; OPTICAL MICROSCOPY;

ARTIFACTS IDENTIFICATION; BACKGROUND-FREE IMAGING; ERROR-SIGNAL ARTIFACTS; FAR-FIELD ARTIFACTS;

OBJECT RECOGNITION;

EID: 34047096826     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2696066     Document Type: Article

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