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Volumn 74, Issue 8, 2003, Pages 3670-3674
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Enhancement of the weak scattered signal in apertureless near-field scanning infrared microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
INFRARED RADIATION;
MATHEMATICAL TRANSFORMATIONS;
OSCILLATIONS;
SCANNING;
SIGNAL TO NOISE RATIO;
DIELECTRIC PROBES;
ELECTROMAGNETIC WAVE SCATTERING;
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EID: 0042377545
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1592876 Document Type: Article |
Times cited : (30)
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References (30)
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