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Volumn 74, Issue 8, 2003, Pages 3670-3674

Enhancement of the weak scattered signal in apertureless near-field scanning infrared microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INFRARED RADIATION; MATHEMATICAL TRANSFORMATIONS; OSCILLATIONS; SCANNING; SIGNAL TO NOISE RATIO;

EID: 0042377545     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1592876     Document Type: Article
Times cited : (30)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.