SCOPUS 정보 검색 플랫폼

Volumn 84, Issue 1-2, 2006, Pages 233-238

Recovering of the apertureless scanning near-field optical microscopy signal through a lock-in detection

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); DEMODULATION; HARMONIC ANALYSIS; NANOSTRUCTURED MATERIALS; SCANNING; SIGNAL PROCESSING;

APERTURELESS SCANNING NEAR-FIELD OPTICAL MICROSCOPY (ASNOM); FOURIER HARMONICS; LOCK-IN HARMONICS;

OPTICAL MICROSCOPY;

EID: 33745712661 PISSN: 09462171 EISSN: None Source Type: Journal
DOI: 10.1007/s00340-006-2309-8 Document Type: Article

Times cited : (10)

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