Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip

Applied Optics

Volumn 36, Issue 10, 1997, Pages 2160-2170

  Bachelot, R ^a,b   Gleyzes, P ^a   Boccara, A C ^a  

^a CNRS   (France)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Apertureless; Atomic force microscopy; Near field; Optical microscopy; Reflection mode; Scanning near field optical microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES; ELECTROMAGNETIC FIELDS; ELECTROMAGNETIC WAVE DIFFRACTION; IMAGE ANALYSIS; LIGHT INTERFERENCE; METALS; OPTICAL PROPERTIES; OPTICAL RESOLVING POWER; RAYLEIGH SCATTERING; REFLECTION; SURFACES;

APERTURELESS METALLIC TIP; SCANNING NEAR FIELD OPTICAL MICROSCOPY; TOPOGRAPHY;

OPTICAL MICROSCOPY;

EID: 0031121561     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.002160     Document Type: Article

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