Nanoscale electrical properties of molecular films in the vicinity of platinum ultrathin film electrode

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 7 B, 2003, Pages 4852-4855

  Miyazaki, Takashi ^a   Kobayashi, Kei ^a   Ishida, Kenji ^a   Hotta, Shu ^b   Horiuchi, Toshihisa ^a   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

^b INSTITUTE OF RESEARCH AND INNOVATION   (Japan)

Author keywords

Atomic force microscopy (AFM); Kelvin probe force microscopy (KFM); Oligothiophene; Organic thin film transistor (OTFT)

Indexed keywords

CRYSTAL GROWTH; ELECTRIC POTENTIAL; ELECTRODES; FIELD EFFECT TRANSISTORS; GATES (TRANSISTOR); GRAIN BOUNDARIES; MONOLAYERS; OLIGOMERS; PLATINUM; SILICON WAFERS; THIN FILM TRANSISTORS; ULTRATHIN FILMS;

KELVIN PROBE FORCE MICROSCOPY; METHYLQUINQUETHIOPHENE; MOLECULAR FILMS; OLIGOTHIOPENE; ORGANIC THIN FILM TRANSISTORS;

ATOMIC FORCE MICROSCOPY;

EID: 0141680597     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.4852     Document Type: Article

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