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Japanese Journal of Applied Physics, Part 2: Letters

Volumn 41, Issue 7 A, 2002, Pages

A nano tester: A new technique for nanoscale electrical characterization by point-contact current-imaging atomic force microscopy

(4) Otsuka, Yoichi a Naitoh, Yasuhisa a Matsumoto, Takuya a Kawai, Tomoji a

a OSAKA UNIVERSITY (Japan)

Author keywords

Atomic force microscopy (AFM); Carbon nanotube; Conductivity; Nano device; Point contact; Scanning probe microscopy (SPM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; POINT CONTACTS;

SCANNING PROBE MICROSCOPY (SPM);

IMAGING SYSTEMS;

EID: 0036650708 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.41.l742 Document Type: Article

Times cited : (29)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.