Ultrahigh-vacuum third-order spherical aberration (Cs) corrector for a scanning transmission electron microscope

Microscopy and Microanalysis

Volumn 12, Issue 6, 2006, Pages 456-460

  Mitsuishi, Kazutaka ^a   Takeguchi, Masaki ^a   Kondo, Yukihito ^b   Hosokawa, Fumio ^b   Okamoto, Kimiharu ^b   Sannomiya, Takumi ^b   Hori, Madoka ^b   Iwama, Takeshi ^b   Kawazoe, Muneyuki ^b   Furuya, Kazuo ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JEOL LTD   (Japan)

Author keywords

Aberration corrector; Ronchigram; Scanning transmission electron microscopy

Indexed keywords

EID: 33947516328     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060661     Document Type: Conference Paper

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