Local crack closure measurements: Development of a measurement system using computer vision and a far-field microscope

ASTM Special Technical Publication

Volumn , Issue 1343, 1999, Pages 145-156

  Sutton, Michael A ^a   Zhao, Wei ^a   McNeill, Stephen R ^a   Helm, Jeffrey D ^a   Piascik, Robert S ^b   Riddell, William T ^b  

^a University of South Carolina   (United States)

^b NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; FATIGUE OF MATERIALS; IMAGING SYSTEMS; INTERFACES (COMPUTER); LITHOGRAPHY; LOADS (FORCES); MECHANICAL VARIABLES MEASUREMENT; MICROSCOPES; OPTICAL CORRELATION; PERSONAL COMPUTERS; SPECKLE;

CRACK OPENING DISPLACEMENT; FATIGUE CRACK CLOSURE; TWO DIMENSIONAL DIGITAL IMAGE CORRELATION;

CRACK PROPAGATION;

EID: 0033360220     PISSN: 10403094     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1520/stp15755s     Document Type: Conference Paper

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