Thickness dependence on the thermal stability of silver thin films

Applied Physics Letters

Volumn 81, Issue 22, 2002, Pages 4287-4289

  Kim, H C ^a   Alford, T L ^a   Allee, D R ^a  

^a Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC CONDUCTIVITY; METALLIC FILMS; THERMODYNAMIC STABILITY;

SILVER THIN FILMS;

THIN FILMS;

EID: 0037175834     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1525070     Document Type: Article

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