Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 477-486

  Wang, Zhanglei ^a   Chakrabarty, Krishnendu ^a  

^a Duke University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEFECTS; ELECTRIC FAULT LOCATION; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY;

CLUSTERED DEFECTS; CONNECTION FAULTS; NANOFABRICS; SWITCHBLOCKS;

BUILT-IN SELF TEST;

EID: 33847124358     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584008     Document Type: Conference Paper

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