-
1
-
-
0035304065
-
Review on materials, microsensors, systems, and devices for high-temperature and harsh-environment applications
-
Werner M R and Fahrner W R 2001 Review on materials, microsensors, systems, and devices for high-temperature and harsh-environment applications IEEE Trans. Indust. Electron. 48 249-57
-
(2001)
IEEE Trans. Indust. Electron.
, vol.48
, Issue.2
, pp. 249-257
-
-
Werner, M.R.1
Fahrner, W.R.2
-
3
-
-
0036544460
-
Capacitive pressure sensor with monolithically integrated CMOS readout circuit for high temperature applications
-
Kasten K, Kordas N, Kappert H and Mokwa W 2002 Capacitive pressure sensor with monolithically integrated CMOS readout circuit for high temperature applications Sensors Actuators A 97-98 83-7
-
(2002)
Sensors Actuators
, vol.97-98
, Issue.1-2
, pp. 83-87
-
-
Kasten, K.1
Kordas, N.2
Kappert, H.3
Mokwa, W.4
-
5
-
-
24144437369
-
A high performance micromachined piezoresistive accelerometer with axially stressed tiny beams
-
Huang S, Li X, Song Z, Wang Y, Yang H, CHe L and Jiao J 2005 A high performance micromachined piezoresistive accelerometer with axially stressed tiny beams J. Micromech. Microeng. 15 993-1000
-
(2005)
J. Micromech. Microeng.
, vol.15
, Issue.5
, pp. 993-1000
-
-
Huang, S.1
Li, X.2
Song, Z.3
Wang, Y.4
Yang, H.5
Che, L.6
Jiao, J.7
-
6
-
-
9744224355
-
Fabrication of a CMOS compatible pressure sensor for harsh environments
-
Pakula L S, Yang H, Pham H T and French P J 2004 Fabrication of a CMOS compatible pressure sensor for harsh environments J. Micromech. Microeng. 14 1478-83
-
(2004)
J. Micromech. Microeng.
, vol.14
, Issue.11
, pp. 1478-1483
-
-
Pakula, L.S.1
Yang, H.2
Pham, H.T.3
French, P.J.4
-
8
-
-
0009159576
-
Temperature measurement during rapid thermal annealing using MEMS
-
Nieva P M, Zavracky P M, Adams G G, Tada H, Abramson A R, Miaoulis I and Wong P 1999 Temperature measurement during rapid thermal annealing using MEMS Proc. 5th ASME/JSME Joint Thermal Engineering Conf.
-
(1999)
Proc. 5th ASME/JSME Joint Thermal Engineering Conf.
-
-
Nieva, P.M.1
Zavracky, P.M.2
Adams, G.G.3
Tada, H.4
Abramson, A.R.5
Miaoulis, I.6
Wong, P.7
-
9
-
-
22444446832
-
Polycrystalline silicon-carbide surface-micromachined vertical resonators: Part II. Electrical testing and material property extraction
-
Wiser R, Tabib-Azar M, Mehregany M and Zorman C 2005 Polycrystalline silicon-carbide surface-micromachined vertical resonators: part II. Electrical testing and material property extraction J. Microelectromech. Syst. 14 579-89
-
(2005)
J. Microelectromech. Syst.
, vol.14
, Issue.3
, pp. 579-589
-
-
Wiser, R.1
Tabib-Azar, M.2
Mehregany, M.3
Zorman, C.4
-
10
-
-
3042738007
-
Silicon carbide membrane relative humidity sensor with aluminum electrodes, micromechanical systems
-
Connolly E J, Pham H, Groeneweg J, Sarro P M and French P J 2004 Silicon carbide membrane relative humidity sensor with aluminum electrodes, micromechanical systems Tech. Digest 17th IEEE Int. Conf. on MEMS pp 193-6
-
(2004)
Tech. Digest 17th IEEE Int. Conf. on MEMS
, pp. 193-196
-
-
Connolly, E.J.1
Pham, H.2
Groeneweg, J.3
Sarro, P.M.4
French, P.J.5
-
11
-
-
18844397025
-
Wafer-level mechanical characterization of silicon nitride MEMS
-
Kaushik A, Kahn H and Heuer A H 2005 Wafer-level mechanical characterization of silicon nitride MEMS J. Microelectromech. Syst. 14 359-67
-
(2005)
J. Microelectromech. Syst.
, vol.14
, Issue.2
, pp. 359-367
-
-
Kaushik, A.1
Kahn, H.2
Heuer, A.H.3
-
12
-
-
0009723969
-
Optical properties of thin-film silicon-compatible materials
-
Poenar D P and Wolffenbuttel R F 1997 Optical properties of thin-film silicon-compatible materials Appl. Opt. 36 5122-8
-
(1997)
Appl. Opt.
, vol.36
, Issue.21
, pp. 5122-5128
-
-
Poenar, D.P.1
Wolffenbuttel, R.F.2
-
13
-
-
33846035722
-
-
Nieva P M 2004 Design and analysis of MEMS-based micro-opto-mechanical vibration sensors PhD Thesis Department of Electrical and Computer Engineering, Northeastern University
-
(2004)
PhD Thesis
-
-
Nieva, P.M.1
-
14
-
-
0037302470
-
Microcavity interferometry for MEMS characterization
-
Stievater T H, Rabinovich W S, Newman H S, Ebel J L, Mahon R, McGee D J and Goetz P G 2003 Microcavity interferometry for MEMS characterization J. Microelectromech. Syst. 12 109-16
-
(2003)
J. Microelectromech. Syst.
, vol.12
, Issue.1
, pp. 109-116
-
-
Stievater, T.H.1
Rabinovich, W.S.2
Newman, H.S.3
Ebel, J.L.4
Mahon, R.5
McGee, D.J.6
Goetz, P.G.7
-
15
-
-
79956013447
-
Micromachined Fabry-Perot interferometer for motion detection
-
Waters R L and Aklufi M E 2002 Micromachined Fabry-Perot interferometer for motion detection Appl. Phys. Lett. 81 3320-2
-
(2002)
Appl. Phys. Lett.
, vol.81
, Issue.18
, pp. 3320-3322
-
-
Waters, R.L.1
Aklufi, M.E.2
-
16
-
-
0035439352
-
Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS
-
Jensen B D, de Boer M P, Masters N D, Bitsie F and LaVan D A 2001 Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS J. Microelectromech. Syst. 10 336-45
-
(2001)
J. Microelectromech. Syst.
, vol.10
, Issue.3
, pp. 336-345
-
-
Jensen, B.D.1
De Boer, M.P.2
Masters, N.D.3
Bitsie, F.4
Lavan, D.A.5
-
20
-
-
0032762357
-
Theoretical and experimental study on airflow damping of vibrating microcantilevers
-
Hosaka H and Itao K 1999 Theoretical and experimental study on airflow damping of vibrating microcantilevers J. Vib. Acoust. ASME 121 64-9
-
(1999)
J. Vib. Acoust. ASME
, vol.121
, pp. 64-69
-
-
Hosaka, H.1
Itao, K.2
-
23
-
-
0001550969
-
Multi-mode noise analysis of cantilevers for scanning probe microscopy
-
Salapaka M V, Bergh H S, Lai J, Majumdar A and McFarland E 1997 Multi-mode noise analysis of cantilevers for scanning probe microscopy J. Appl. Phys. 81 2480-7
-
(1997)
J. Appl. Phys.
, vol.81
, Issue.6
, pp. 2480-2487
-
-
Salapaka, M.V.1
Bergh, H.S.2
Lai, J.3
Majumdar, A.4
McFarland, E.5
-
25
-
-
0030230992
-
Determining mean and gradient residual stresses in thin films using micromachined cantilevers
-
Fang W and Wickert J A 1996 Determining mean and gradient residual stresses in thin films using micromachined cantilevers J. Micromech. Microeng. 6 301-9
-
(1996)
J. Micromech. Microeng.
, vol.6
, Issue.3
, pp. 301-309
-
-
Fang, W.1
Wickert, J.A.2
-
27
-
-
0033320591
-
Temperature dependence of transmission characteristics of multilayer film narrow bandpass filters
-
Sakaguchi S 1999 Temperature dependence of transmission characteristics of multilayer film narrow bandpass filters Japan. J. Appl. Phys. 38 6362-8
-
(1999)
Japan. J. Appl. Phys.
, vol.38
, Issue.PART 1
, pp. 6362-6368
-
-
Sakaguchi, S.1
|