Visualization of thermally fluctuating surface structure in noncontact atomic-force microscopy and tip effects on fluctuation: Theoretical study of Si(111)-(√3 times; √3)-Ag surface

Physical Review Letters

Volumn 88, Issue 4, 2002, Pages 461061-461064

  Sasaki, Naruo ^a   Watanabe, Satoshi ^b   Tsukada, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRONIC DENSITY OF STATES; IMAGE ANALYSIS; MATHEMATICAL MODELS; OSCILLATIONS; PROBABILITY; SURFACE TREATMENT; VISUALIZATION;

PINNING EFFECTS; TIP EFFECTS;

SURFACE STRUCTURE;

EID: 0037185560     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (17)