Direct visualization of defect density waves in 2D

Physical Review Letters

Volumn 86, Issue 9, 2001, Pages 1809-1812

  Ottaviano, L ^a   Melechko, A V ^b,c   Santucci, S ^a   Plummer, E W ^b,c  

^a UNIVERSITY OF L'AQUILA   (Italy)

^b UNIVERSITY OF TENNESSEE   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL LATTICES; ELECTRON TRANSITIONS; FERMI SURFACE; FOURIER TRANSFORMS; LOW ENERGY ELECTRON DIFFRACTION; LOW TEMPERATURE EFFECTS; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SILICON; SUBSTRATES; TIN;

DEFECT DENSITY WAVE; LOW TEMPERATURE PHASE TRANSITION;

PHASE TRANSITIONS;

EID: 0035248783     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.1809     Document Type: Article

References (23)

1. B. I. Halperin and C. M. Varma, Phys. Rev. B 14, 4030 (1976).
2. I. Baldea and M. Badescu, Phys. Rev. B 48, 8619 (1993).
3. I. Baldea and M. Apostol, J. Phys. C 18, 6135 (1985).
4. A. V. Melechko, J. Braun, H. H. Weitering, and E. W. Plummer, Phys. Rev. Lett. 83, 999 (1999).
5. A. V. Melechko, J. Braun, H. H. Weitering, and E. W. Plummer, Phys. Rev. B 61, 2235 (2000).
6. H. H. Weltering, J. M. Carpinelli, A. V. Melechko, J. Zhang, M. Bartkowiak, and E. W. Plummer, Science 285, 2107 (1999).
7. J. S. Pedersen, R. Feidenhans'l, M. Nielsen, and K. Kjaer, Surf. Sci. 189/190, 1047 (1987).
8. J. M. Carpinelli, H. H. Weitering, M. Bartkowiak, E. W. Plummer, and R. Stumpf, Nature (London) 381, 398 (1996).
9. J. M. Carpinelli, H. H. Weitering, M. Bartkowiak, R. Stompf, and E. W. Plummer, Phys. Rev. Lett. 79, 2859 (1997).
10. T. E. Kidd, T. Miller, M. Y. Chou, and T.-C. Chiang, Phys. Rev. Lett. 85, 3684 (2000).
11. J. Nogami, S.-I. Park, and C. F. Quate, J. Vac. Sci. Technol. A 7, 1919 (1989).
12. K. M. Conway, J. E. McDonald, and C. Norris, Surf. Sci. 215, 555 (1989).
13. T. Kinoshita, S. Kono, and T. Sagawa, Phys. Rev. B 34, 3011 (1986).
14. G. Profeta, A. Continenza, L. Ottaviano, and A. J. Freeman, Phys. Rev. B 62, 1556 (2000).
15. L. Ottaviano, M. Crivellari, L. Lozzi, and S. Santucci, Surf. Sci. 445, L41 (2000).
16. R. I. G. Uhrberg, H. M. Zhang, T. Balasubramanian, S. T. Jemander, N. Lin, and G. V. Hansson, Phys. Rev. B 62, 8082 (2000).
17. C. Törnevik, M. Göthelid, M. Hammar, U. O. Karlsson, N. G. Nilsson, S. A. Flodström, C. Wigren, and M. Östling, Surf. Sci. 314, 179 (1994).
18. A higher intensity background in the vicinity of (3 X 3) spots in the LEED pattern can be observed at high defect density.
19. F. Flores, J. Ortega, R. Pérez, A. Charrier, F. Thibaudau, J.-M. Deberver, and J.-M. Themlin, Prog. Surf. Sci. (to be published).
20. R. I. Uhrberg (private communication).
21. O. Bunk, J. H. Zeysing, G. Falkenberg, R. L. Johnson, M. Nielsen, M. M. Nielsen, and R. Feidenhans'l, Phys. Rev. Lett. 83, 2226 (1999).
22. L. Ottaviano, M. Crivellari, G. Profeta, A. Continenza, L. Lozzi, and S. Santucci, J. Vac. Sci. Technol. A 18, 1946 (2000).
23. L. Ottaviano, G. Profeta, A. Continenza, S. Santucci, A. J. Freeman, and S. Modesti, Surf. Sci. 464, 57 (2000).