Electric field enhancement by a nanometer-scaled conical metal tip in the context of scattering-type near-field optical microscopy

Applied Physics Letters

Volumn 88, Issue 10, 2006, Pages

  Goncharenko, A V ^a,c   Dvoynenko, M M ^a   Chang, Hung Chih ^a   Wang, Juen Kai ^b  

^a INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; CONES; ELECTRIC FIELD EFFECTS; LASERS; NANOSTRUCTURED MATERIALS; SILVER;

CONE ANGLE; CONICAL METAL TIP; PEAK ENHANCEMENT RESONANT POSITION; WAVELENGTH;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 33644929518     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2183362     Document Type: Article

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